Cross-Scenario Industrial Defect Detection via Domain-Robust Training and Metric-Aligned Selection

arXiv:2610.19540 · cs.CV · Submitted 2026-10-14 · Read on arXiv

cs.CV

Submitted: 2026-10-14

Updated: 2026-10-14

Comments: This paper has been accepted for presentation in IEEE ICME 2026

License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/

Related papers