Bend Contour Electron Tomography (BCET): Quantitative strain and topography mapping
cond-mat.mes-hall, cond-mat.mtrl-sci, physics.comp-ph
Submitted: 2026-09-17
Updated: 2026-09-17
License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/
Terminology
Sources
- Stochastic Multiresolution Image Sketching for Inverse Imaging Problems
- Strain-induced multiferroicity in Cr1/3NbS2
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