Failure-Mechanism Transferability of Cumulative-Damage Features for Health State Estimation of SiC Power Modules

arXiv:2608.08365 · eess.SY, cs.LG, cs.SY · Submitted 2026-08-11 · Read on arXiv

Mattia Scarpa, Evgeny Kusmenko, Francesco Toso, Mattia Bruschetta, Ruggero Carli, Simon Achatz

eess.SY, cs.LG, cs.SY

Submitted: 2026-08-11

Updated: 2026-08-12

Comments: Accepted at the 52nd Annual Conference of the IEEE Industrial Electronics Society (IECON 2026). 9 pages, 3 figures, 4 tables

License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/

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