Quantum annealing of the random transverse-field Ising model in one, two, and three dimensions
The study investigates how slow quantum annealing prevents defects in a random transverse-field Ising model by using the adiabatic theorem. The authors developed a scaling theory based on Strong-Disorder Renormalization Group (SDRG) to describe error formation events. Results show that defect density decreases logarithmically with annealing time, and the required bottleneck time scales with system size in all dimensions.