Linear dichroic soft X-ray microscopy of ferroelectric stripe domains in epitaxial K 0.6 Na 0.4 NbO 3
Researchers used soft X-ray microscopy with linear dichroism to image strain-stabilized ferroelectric stripe domains in K0.6Na0.4NbO3 films. By thinning the substrate, they overcame absorption issues and resolved stripe periods down to 44 nm, revealing nanoscale domain structures influenced by epitaxial strain.