Anomalous Edge Contrast in Magnetic Force Imaging of 2D Topological Insulators
Researchers used magnetic force microscopy (MFM) to image 2D topological insulators like Bi2Te3 plates. They found that anomalous edge contrast is caused by two mechanisms: a persistent current and a Faraday induction effect. This suggests novel circuit elements based on these topological properties, proving the robustness of topological edge states.