Imaging defects in two-dimensional crystals by convergent beam electron diffraction
Convergent beam electron diffraction (CBED) allows atomic-precision imaging of defects in 2D materials using a single measurement, bypassing expensive optics or scanning. Researchers demonstrated that unique 'fingerprint' CBED patterns for graphene defects can be extracted from simulated data. These patterns enable the reconstruction of atomic positions with high accuracy, showing that the technique can resolve individual defect structures.