Rare Event Simulation of Quantum Error-Correcting Circuits
This research developed a novel rare event simulation technique to calculate logical failure rates for quantum error-correcting circuits under very low physical component failure regimes, specifically below $10^{-20}$. By adapting Metropolis-Hastings Bayesian algorithms and subset sampling, the method allows researchers to study fault-tolerant codes in regimes previously inaccessible to standard Monte Carlo simulations.