On-chip calibrated radio-frequency measurement at cryogenic temperatures for determination of SrTiO3-based capacitor properties
Researchers developed an on-chip calibrated radio-frequency measurement system operating at 4 K to accurately characterize SrTiO3 varactors, overcoming errors from long RF lines. This precise calibration allows for accurate impedance measurements across a wide frequency range, enabling the evaluation of these components under cryogenic conditions critical for quantum information processing.