EBSD and Subtle Crystallographic Differences - A Study of Resolving Interlayer Spacings in Nb-Ni and Nb-Co mu-phases
The study tested Electron Backscatter Diffraction (EBSD) to resolve subtle interlayer spacings in Nb-Ni and Nb-Co mu-phase intermetallics, which are important for alloy properties. Researchers used pattern matching against computer simulations guided by XRD data to predict these spacings. The results showed EBSD can measure key spacing features, though it couldn't fully resolve site occupancy changes.